Semiconductor Testers

Source Measure Unit 210V 3A 1ch

Source Measure Unit 20V 3A 1ch

SMU Link SMU4001

The Model 2657A is a high voltage, high power, low current source measure unit (SMU) instrument, which is designed specifically for I-V characterization and tests on high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials. It's ease of use improves productivity in R&D, production test, and reliability environments. It is supported by the industry’s most powerful parametric characterization software platforms.

The high power Model 2651A SourceMeter SMU Instrument is specifically designed for (pulsed) I-V characterization and tests on high power electronics . This SMU instrument helps improving productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies .

The Keithley model 2636B is a dual channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2635B is a single channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2634B is a dual channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2614B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2612B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2611B is a single channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2604B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2602B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2601B is a single channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PK3 is a preconfigured solution for power devices, high κ dielectric, deep submicron CMOS device characterization. The configuration can be changed / upgraded any time.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PK2 is a preconfigured solution for high κ dielectric, deep submicron CMOS characterization. The configuration can be changed / upgraded any time.

40% Black Friday Discount from 29-11 to 6-12!

The 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 10A/1000W pulse current and 7A/100W DC current capability combined with dual 18-bit 1MS/s digitizers, the Model 2461 is optimized for characterizing and testing high power materials, devices, and modules, such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, circuit protection devices, solar cells and panels, high brightness LEDs and lighting systems, electrochemical cells and batteries, and much more.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PK1 is a preconfigured solution for high resolution I-V characterization on two and three terminal (packaged) devices. The configuration can be changed / upgraded any time.

The 2460 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 7A DC and pulse current capability, the 2460 is optimized for characterizing and testing high power materials, devices, and modules such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, power MOSFETs, solar cells and panels, LEDs and lighting systems, electrochemical cells and batteries, and much more.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization ( DC and Pulsed I-V, AC ) of materials and devices. A user can select the required hardware modules and change / upgrade this configuration any time. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization.

Consult our product specialist to define the best configuration for your measurement needs.

The 2450 is Keithley’s next-generation SourceMeter source measure unit (SMU) instrument that truly brings Ohm’s law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier. The 2450 is the SMU for everyone: a versatile instrument, particularly well-suited for characterizing modern scaled semiconductors, nano-scale devices and materials, organic semiconductors, printed electronics, and other small-geometry and low-power devices

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200-BTI-A is a package including hardware modules ( PulseMeasureUnits, Remote Switching Modules), cabling and software te perform Ultra Fast BTI test on advanced CMOS transistor structures.

200 mm Automated Probe System with ShielDEnvironment™, for most accurate and reliable DC/CV, RF and mmW measurements

MPI TS150 is an open, easy to use and cost effective manual probe system designed for precision analysis of substrates and wafers up to 150mm.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. The four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

MPI  TS150 manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150mm.

They may be configured to support a wide variety of applications such as  Failure Analysis ,  Design Validation/IC Engineering ,  Wafer Level Reliability ,  High Power ,  Device Characterization ,  MEMS  and  Signal Integrity  as well.

MPI TS200 manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 200mm.

They may be configured to support a wide variety of applications such as  Failure Analysis ,  Design Validation/IC Engineering ,  Wafer Level Reliability ,  High Power ,  Device Characterization ,  MEMS  and  Signal Integrity  as well.

MPI  TS300 manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 300mm.

They may be configured to support a wide variety of applications such as  Failure Analysis ,  Design Validation/IC Engineering ,  Wafer Level Reliability ,  High Power ,  Device Characterization ,  MEMS  and  Signal Integrity  as well.

MPI TS150–THZ engineering probe system is a dedicated, cost effective, manual probe system designed especially for precision analysis of substrates and 150 mm wafers in sub THz range.  The system is extremely stable, with a large probe platen, and a low-profile design. Each of these essential elements are required to support a wide variety of RF and mmW applications such as broadband up to 220 GHz, banded solutions up to 1.1THz, load-pull and RF noise. 

MPI TS200–THZ probe system expand MPI one-of-a-kind system solutions for emerging THz applications by adding active impedance tuner integrations on the same probe stations. It’s the industry’s first explicitly designed 150 mm and 200 mm probe systems providing accurate tests for the combination of requirements for mm-wave, THz, and automated impedance tuner applications with best possible measurement directivity.

The MPI TS200-ShielDEnvironment™ (TS200-SE) is designed to ensure advanced EMI/RFI/light-tight shielding, ultra-low noise, low leakage measurement capabilities in a temperature range from -60 to +300°C.