Semiconductor Testers

Optical spectral characterization—rapid, reliable and repeatable

• A continuously tunable laser is an essential instrument in R&D labs and on production floors.
• It covers a variety of applications where rapid, continuous wavelength tuning is needed.
• The T200S delivers speed and high power while sweeping, in addition to excellent linewidth at fixed wavelength
• Up to 200 nm/s scanning speed
• 10dBm over tunable spectra range
• Excellent SSER
• Wavelenght coverage: O and CL bands
• Wavelenght tuning and continuous sweep modes
• Active mode-hop-free operation

Optical spectral characterization—rapid, reliable and repeatable

• A continuously tunable laser is an essential instrument in R&D labs and on production floors.
• It covers a variety of applications where rapid, continuous wavelength tuning is needed.
• The T500S offers excellent wavelength coverage, delivers speed and high power while sweeping.
• The laser also shows excellent linewidth characteristics when operated at fixed wavelength.
• Up to 200 nm/s scanning speed
• 14dBm over tunable spectra range
• Excellent SSER
• Six models covering 1240 nm – 1680 nm
• Wavelenght tuning and continuous sweep modes
• Active mode-hop-free operation

Versatile multitechnology portable test platform

The FTB-4 Pro delivers all the power of a high-end platform in a go-where-you-need field-testing tool.

CT440/CT440-PDL - optical component tester

Compact tester for fast and accurate characterization of passive optical components

OSICS T100 - External cavity tunable laser module

Stepped external-cavity tunable laser modules that cover all telecom wavelengths

OSA20 - optical spectrum analyzer

Fastest diffraction-grating-based instrument operating from 1250 to 1700 nm. Provides fast, accurate, high dynamic range scan. Unique touch-sensitive display with multitouch gesture control.

FTBx-5243-HWA - High wavelength accuracy optical spectrum analyzer

Optical spectrum analyzer (OSA) for DWDM, CWDM, and DWDM over CWDM networks

Bring power to your lab with a powerful, scalable and hot-swappable eight-slot rackmount platform designed for advanced lab and manufacturing applications.

Lab - Optical spectrum analyzers for the lab

Highly accurate, easy-to-use intelligent optical spectrum analyzers (OSAs) for analysis of CWDM and DWDM networks.

XTM-50 - Tunable filter with adjustable bandwidth

With the XTM-50 both center wavelength and bandwidth can be independently adjusted. It is manually controlled and versions are available covering all the key telecom wavelengths from 1260 nm to1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.

XTA-50 - Tunable filter with adjustable bandwidth

Electronically controlled. Center wavelength and bandwidth can both be set precisely and independently. Covers all key wavelengths from 1260 nm to 1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.

Source Measure Unit 210V 3A 1ch

Source Measure Unit 20V 3A 1ch

SMU Link SMU4001

The Model 2657A is a high voltage, high power, low current source measure unit (SMU) instrument, which is designed specifically for I-V characterization and tests on high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials. It's ease of use improves productivity in R&D, production test, and reliability environments. It is supported by the industry’s most powerful parametric characterization software platforms.

The high power Model 2651A SourceMeter SMU Instrument is specifically designed for (pulsed) I-V characterization and tests on high power electronics . This SMU instrument helps improving productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies .

The Keithley model 2636B is a dual channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2635B is a single channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2634B is a dual channel, low current SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2614B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2612B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2611B is a single channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley model 2604B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated or dedicated applications.

The Keithley model 2602B is a dual channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

This new pulser offers leading 10 A current pulse output at 10 V with a pulse width of 10 μs, for testing vertical cavity surface emitting lasers (VCSEL) , LEDs , common mode filters, semiconductor device characterization, surge protection testing, and more

The Keithley model 2601B is a single channel SMU within the Keithley’s Series 2600B System SMU instruments. The model integrates a precision power supply, true current source, DMM, and electronic load with pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high volume parallel test.

The Keithley 4200A-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PKC High Power I-V and C-V Parameter Analyzer is a preconfigured solution for measurements on up to three terminal (power) devices. The configuration can be changed / upgraded any time.

1100V 1A 20W Sourcemeter SMU instrument

The Keithley 4200A-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PKB High Resolution I-V and C-V Parameter Analyzer is a preconfigured solution inlcuding everything you need to perform I-V and C-V measurements on up to three terminal devices. The configuration can be changed / upgraded any time.

The 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 10A/1000W pulse current and 7A/100W DC current capability combined with dual 18-bit 1MS/s digitizers, the Model 2461 is optimized for characterizing and testing high power materials, devices, and modules, such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, circuit protection devices, solar cells and panels, high brightness LEDs and lighting systems, electrochemical cells and batteries, and much more.

The Keithley 4200A-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-SCSA-PKA is a preconfigured solution for high resolution I-V characterization on two and three terminal (packaged) devices. The configuration can be changed / upgraded any time.

The 2460 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 7A DC and pulse current capability, the 2460 is optimized for characterizing and testing high power materials, devices, and modules such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, power MOSFETs, solar cells and panels, LEDs and lighting systems, electrochemical cells and batteries, and much more.

The Keithley 4200-SCS is a turnkey system solution for electrical characterization ( DC and Pulsed I-V, AC ) of materials and devices. A user can select the required hardware modules and change / upgrade this configuration any time. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization.

Consult our product specialist to define the best configuration for your measurement needs.

The 2450 is Keithley’s next-generation SourceMeter source measure unit (SMU) instrument that truly brings Ohm’s law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier. The 2450 is the SMU for everyone: a versatile instrument, particularly well-suited for characterizing modern scaled semiconductors, nano-scale devices and materials, organic semiconductors, printed electronics, and other small-geometry and low-power devices

The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200-BTI-A is a package including hardware modules ( PulseMeasureUnits, Remote Switching Modules), cabling and software te perform Ultra Fast BTI test on advanced CMOS transistor structures.

Low voltage sourcemeter