FTB-4 Pro - Test platform
EXF-FTB-4-Pro
Versatile multitechnology portable test platform
The FTB-4 Pro delivers all the power of a high-end platform in a go-where-you-need field-testing tool.
EXF-FTB-4-Pro
The FTB-4 Pro delivers all the power of a high-end platform in a go-where-you-need field-testing tool.
TEK-2401.
TEK-2614B
TEK-2634B
TEK-2604B
TEK-2601B
TEK-2602B
TEK-2611B
TEK-2612B
TEK-2635B
TEK-2636B
TEK-2460
TEK-2461
The 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 10A/1000W pulse current and 7A/100W DC current capability combined with dual 18-bit 1MS/s digitizers, the Model 2461 is optimized for characterizing and testing high power materials, devices, and modules, such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, circuit protection devices, solar cells and panels, high brightness LEDs and lighting systems, electrochemical cells and batteries, and much more.
EXF-FTBx-5243-HWA
FTBx-5243-HWA - High wavelength accuracy optical spectrum analyzer
Optical spectrum analyzer (OSA) for DWDM, CWDM, and DWDM over CWDM networks
TEK-2657A
The Model 2657A is a high voltage, high power, low current source measure unit (SMU) instrument, which is designed specifically for I-V characterization and tests on high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials. It's ease of use improves productivity in R&D, production test, and reliability environments. It is supported by the industry’s most powerful parametric characterization software platforms.
TEK-2651A
EXF-XTA-50
XTA-50 - Tunable filter with adjustable bandwidth
Electronically controlled. Center wavelength and bandwidth can both be set precisely and independently. Covers all key wavelengths from 1260 nm to 1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.
TEK-2450
MPI-AC2-2
- GSG alumina coplanar calibration substrate
- For probes pitch from 100 µm to 250 µm
- Supports SOLT, SOLR, LRM and TRL probe-tip calibration methods
- Substrate thickness 635 µm
- Applicable up to 110 GHz
- With alignment mark
- Includes a set of offset standards for precise calibration
MPI-AC3
- GS/SG alumina coplanar calibration substrate
- For probe pitch from 50 to 250 micron
- Supports SOLT, LRM and TRL probe-tip calibration methods
MPI-T26V-GSXXXX
- DC to 26 GHz RF probe
- Connector type : SMA
- 90 degree connector
- GS tip configuration
- Pitch from 50 µm to 450 µm with 25 µm step
- Pitch from 450 µm to 1250 µm with 50 µm step
- Available pitches 90 µm
- Please specify the required pitch during ordering process
MPI-T26A-GSGXXXX
- DC to 26 GHz RF probe
- Connector type : SMA
- 45 degree connector
- GSG tip configuration
- Pitch from 50 µm to 450 µm with 25 µm step
- Pitch from 450 µm to 1250 µm with 50 µm step
- Available pitches 90 µm
- Please specify the required pitch during ordering process
MPI-T26A-SGXXXX
- DC to 26 GHz RF probe
- Connector type : SMA
- 45 degree connector
- SG tip configuration
- Pitch from 50 µm to 450 µm with 25 µm step
- Pitch from 450 µm to 1250 µm with 50 µm step
- Available pitches 90 µm
- Please specify the required pitch during ordering process
MPI-T145A-GSGXXXX
- DC to 145 GHz RF probe
- Connector type: 0.8 mm
- 45 degree connector
- GSG tip configuration
- Contact width: 15 µm
- Available pitches: 50 µm, 75 µm, 90 µm, 100 µm, 125 µm, and 150 um
- Please specify the required pitch during ordering process
MPI-T40A-GS/SG/GSGXXXX
- DC to 40 GHz RF probe
- Connector type : K (2.92 mm)
- 45 degree connector
- GSG , GS and SG tip configuration are possible, please chose on order
- Pitch from 50 µm to 450 µm with 25 µm step
- Pitch from 450 µm to 800 µm with 50 µm step
- Other available pitches: 90 µm
- Please specify the required pitch during ordering process
MPI-T50A-GS/SG/GSGXXXX
- DC to 50 GHz RF probe
- Connector type : Q (2.4 mm)
- 45 degree connector
- GSG , GS and SG tip configuration are possible, please chose on order
- Pitch from 50 µm to 450 µm with 25 µm step
- Other available pitches: 90 µm, 500um, 550um
- Please specify the required pitch during ordering process
MPI-T67A-GS/SG/GSGXXXX-1
- DC to 67 GHz RF probe
- Connector type : V (1.85 mm)
- 45 degree connector
- GSG , GS and SG tip configuration are possible, please chose on order
- Pitch from 50 µm to 400 µm with 25 µm step
- Available pitches 90 µm
- Please specify the required pitch during ordering process
MPI-T220A-GSGXXXX
- DC to 220 GHz RF probe
- For Anritsu VectorStar ME7838G 220 GHz VNA
- Connector type: 220 GHz interface
- Direct mount to Anritsu VectorStar ME7838G module
- GSG tip configuration
- Contact width 15 µm
- Compatible with open probe system platforms
- Available pitches 50 µm、 75 µm、90 µm、100 µm and 125 µm
- Please specify the required pitch during ordering process
MPI-ITS25-THZ
ITS25-THZ IMPACT™ Test Solution, enables cost effective mmW and THZ testing with the highest possible measurement accuracy
• ITS25-THZ is equipped with dedicated mmW chuck supporting probing of submillimeter-wave MMICs as small as 1 x 1 mm and up to 25 x 25 mm
• The chuck is made completely by ceramics, and supports both the DUT and the calibration standards. Dielectric properties of the chuck material and its design are optimized to suppress possible
propagation of higher-order modes providing accurate system calibration and trustable measurement results at THz frequencies
• The set of MP80 MicroPositioners and unique integration of all types of frequency extenders available on the market is designed for direct wafer probe mount and eliminates the need for additional
waveguide section. This solution guarantees the best possible measurement directivity of the system in the entire measurement frequency range of up to 1.5 THz
• MPI supports ALL available on the market: Frequency Extenders by unique Adaptation (FEAD), for easy reconfiguration and safety operation
EXF-XTM-50
XTM-50 - Tunable filter with adjustable bandwidth
With the XTM-50 both center wavelength and bandwidth can be independently adjusted. It is manually controlled and versions are available covering all the key telecom wavelengths from 1260 nm to1650 nm and bandwidths from 32 pm (4 GHz) to 5 nm.