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TS2500

TS2500

200mm Fully-Automatic Probe Systems for 24/7 Production Tests

Price on Request

Product specifications

SKU MPI-TS2500
Brand MPI

Documentation

Please use the icons below to download any files related to this item. We aim to have the datasheet and/or catalog available.

Description

The MPI TS2500 Series are not engineering probe stations with loader, the Series are explicitly designed for accurate and reliable 24/7 production tests.

The main applications are DC/CV, RF, High Power or testing of MEMS and other sensors under defined test environment.

TS2500-SE is incorporating MPI’s best on the market ShielDEnvironment™ to offer unsurpassed light-tight and EMI-Shielding for accurate ultra-low DC and RF noise measurements.

Key benefits

Software Suite SENTIO®

  • Revolutionary multi-touch, single window GUI for easy and intuitive system operation
  • Scroll, zoom, move commands mimic modern smart mobile devices making everyone the operation expert just in minutes
  • Switching between applications is just a matter of a finger swipe
  • Integrated workflow with MPI RF calibration software QAlibria® provides unparalleled user experience
  • GPIB, TCP/IP interface for remote control

Thermal Control

  • Thermal chuck can be operated by using the fully integrated touchscreen display
  • Placed at convenient location in front of the operator for fast operation and immediate feedback

Microscope and Optics Options

  • Stable microscope bridge mount with 50 x 50 x 140 mm programmable movement
  • Various optics options available such as MPI AMZ12 with up to 12x optical zoom or MPI iMAG® - the digital microscope

ShielDCap™

  • Consequent shielding and easy re-configuration
  • Allows up to 4-port RF or up to 8-ports DC/Kelvin or a combination of those configurations
  • Probe card version available

MicroPositioners

  • Supports up to 8 DC or 4 RF and 4 DC MicroPositioners
  • Wide range of MicroPositioners available, including programmable and large area for mmW applications
  • Dedicated Coax, Triax and Kelvin probe arms
  • 4.5” / 6.5” probe card holder: standard or dedicated for long term

RF Calibration

  • Integrated two auxiliary chucks for RF calibration substrates
  • Built-in ceramic for accurate calibration up to THz frequencies
  • 1 μm flatness for consistent contact across the wafer

Production Reliability

  • Designed for 24/7 production reliability
  • Safety cover with interlocks providing a closed environment

Integrated Hardware Control Panel

  • Faster, safer and more convenient system operation and control
  • Keyboard and the mouse are at the system control panel for a singlepoint operation with the system and controlling test instrumentation

ShielDEnvironment™

  • Advanced EMI / RFI / Light-tight shielding for the best in class 1/f noise test results
  • fA low-leakage capabilities

AirCool® PRIME Thermal Chuck

  • Designed by MPI and ERS for faster transitions and reduced soaking time
  • Wide temperature range -60 °C to 300 °C with unique configuration capabilities
  • Convenient location of the control panel for fast and easy interaction with the system
  • Reduced footprint by smart integration of the chiller space
  • Significant savings via recycling of chuck air for purge application

Wafer Loading

  • Standard two cassettes for 100, or 150 or 200 mm wafers