TS2000-SE
200mm Shielded Automated Probe Station
200mm Shielded Automated Probe Station
TS3500 Series with WaferWallet® = Accuracy + Flexibility + Automation
Advanced 200mm Automated High Power Solution
200mm Automated Probe Station
300 mm Automated Probe System with ShielDEnvironment™
The Keithley 4200-SCS is a turnkey system solution for electrical characterization of materials and devices. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. The four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
200mm Manual System for mmW and THz Application
MPI's Most Versatile 200 mm Platform
MPI's Most Versatile 200 mm Platform
The Keithley 4200-SCS is a turnkey system solution for electrical characterization ( DC and Pulsed I-V, AC ) of materials and devices. A user can select the required hardware modules and change / upgrade this configuration any time. The system is operated through the pre-installed Clarius Software. Visibile on a 15.6" Full HD touchscreen, the Clarius user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization.
Consult our product specialist to define the best configuration for your measurement needs.