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TS600-PCB

MPI

TS600-PCB

Large Wafer and PCB testing for Accurate and Reliable RF and mmW Measurements on PCB Boards

Price on Request

Product specifications

SKU MPI-TS600-PCB
Manufacturer MPI

Documentation

Please use the icons below to download any files related to this item. We aim to have the datasheet and/or catalog available.

Description

The TS300-PCB is our most adaptable manual probe station, designed for testing on wafers up to 300mm and large PCB boards up to 610x500mm. Ideal for RF, mmW , Signal Integrity measurements, Failure Analysis , and Design Validation applications, the TS300-PCB features an air-bearing stage, Probe Hover Control™, and a dedicated probe platen with large microscope movement for extensive probing coverage.

Key benefits

Microscope Mount and Movements

  • Stable bridge for high quality optics
  • 600 x 550 mm fast movement range, to be combined with 50 x 50 mm XY manual movements
  • 150 mm Z adjustment in 7x 25mm steps combined with 32 mm manual focus drive (coarse/fine)

Optics

  • SZ12 with large 95 mm WD and optical resolving power of 2.5 μm
  • Combined with CAM-4000P for detailled observation
  • Ideal for testing on small RF pads

Probe Gantries

  • Stable and rigid design
  • Supports DC/CV and RF measurements
  • 3 gantries in E/W/N position
  • Designed for 550 x 500 mm XY probing area

Probe Platen Slider Set

  • Rail-guided MicroPositioner mounting
  • Instrumentation extenders mounted closest to the RF probe

Highly flexible RF MicroPositioner

  • Dedicated PCB version of MP60 for unrivalled stability and flexibility
  • Integrated yaw base
  • Probe arm with two horizontal +/- 90° pivots and large vertical dovetail mount

TITANTM Probes

  • Robust Ni-alloy tip material for probing on hard and rough pads
  • Short forward skate for probing on small solder bumps and HDI traces
  • Unique probe tip visibility for consistent contact and repeatable calibration and measurements
  • Flexible tips for probing on uneven surfaces
  • Deep and extra-deep access for test on populated boards
  • Varoius configurations, incl. dual probes w. adjustable channel-to-channel pitch

Instrument Shelf

  • Test instrument(s) located above the station
  • Shortest connection to RF probes, ≥ 800 mm

QAlibria®

  • Metrology-grade multiline TRL calibration by integration with NIST StatistiCal
  • TMR/TMRR calibration methods with on-board standards
  • Simple, intuitive, multitouch operator interface
  • Open data base for probes and custom calibration standards

RF Calibration

  • QAlibria® as unique calibartion software
  • Optional 3 auxiliary chucks for calibration substrates
  • Built-in ceramic for accurate calibration
  • 1 μm flatness for consistent contact quality

Optional Mounts

  • For 1x or 2x monitors, standard or large size
  • Keyboard tray
  • Laptop tray

PCB-Holders

  • Various holders for horizontal and vertical PCB mounting
  • Free mounting on large breadbord top plate on stage
  • For horizontal PCB‘s up to 550 x 500 mm
  • For vertical PCB‘s from 10 x 10 mm up to 100 mm
  • Optional holder for 3 AUX sites, to mount on breadboard or on MAG base for horizontal and vertical mount - 45° mirrors for easy probe positioning on vertical PCB

XYZ Stage Movement

  • Universal breadboard top plate for highest flexibility
  • 100 x 100 mm XY total stage movement
  • 50 mm Z movement
  • Can be easily removed to adopt for testing large vertical boards

Vibration Isolation Table

  • Standard or TMC type on request
  • Active vibration dampening and auto-levelling function