Toggle Nav

SiPho

MPI

SiPho

MPI Designed Dedicated SiPH Upgrades for its well-known 200 and 300 mm Probe Systems

Price on Request

Product specifications

SKU MPI-SiPho
Manufacturer MPI

Documentation

Please use the icons below to download any files related to this item. We aim to have the datasheet and/or catalog available.

Description

MPI designed dedicated SiPH upgrades for its well-known 200 and 300 mm probe systems, which includes:

Various options of high-precision fiber alignment systems for ultra-fast scanning routines

Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration

Integrated Z-sensing for detecting the fiber to wafer contact point

Crash protection when using two optical fiber arms

Wide temperature range from -50°C to 200°C

Optional dark box for testing in light tight environment

Extensive software package for supporting easy integration to operator’s test executive

Probe system compatibility:  TS2000-IFE ,  TS2000-SE ,  TS3000 ,  TS3000-SE ,  TS3500 and TS3500-SE

Key benefits

Dedicated for silicon photonics on-wafer test

  • Including various options of high-precision fiber alignment systems for ultra-fast scanning routines
  • Multiple measurement capabilities for O-O, O-E, E-O and E-E de vice configuration
  • Integrated Z-sensing for detecting the fiber to wafer contact point
  • Crash protection when using two optical fiber arms
  • Temperature capability from -50 °C to 200 °C
  • Optional dark box for testing in light tight environment

System compatibility

  • 200 mm: TS2000-IFE and TS2000-SE
  • 300 mm: TS3000, TS3000-SE, TS3500 and TS3500-SE

Silicon Photonics Fiber Alignment Systems

 A Variety of fiber positioning stages and the related software can be easily used with the MPI SiPH probe system. The shortest platen to chuck distance allowing shorter fiber arms with higher stability and less measurement noise. Solutions for just single fiber or multi-fiber-arrays are available, all integrated with automated Z-sensing unit for constant distance of few micrometer to the optical I/O.

Seamless Probe Station Integration

 Necessary optical alignment stages, such as the hexapod, are fully integrated into the SENTIO® probe station control software. Those are operated just like any other automated positioner including its additional alignment features. And not only integrated in the multi touch software, even the hardware control panel supports the SiPH positioner type.