MPI
MPI Designed Dedicated SiPH Upgrades for its well-known 200 and 300 mm Probe Systems
SKU | MPI-SiPho |
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Manufacturer | MPI |
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MPI designed dedicated SiPH upgrades for its well-known 200 and 300 mm probe systems, which includes:
Various options of high-precision fiber alignment systems for ultra-fast scanning routines
Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration
Integrated Z-sensing for detecting the fiber to wafer contact point
Crash protection when using two optical fiber arms
Wide temperature range from -50°C to 200°C
Optional dark box for testing in light tight environment
Extensive software package for supporting easy integration to operator’s test executive
Probe system compatibility: TS2000-IFE , TS2000-SE , TS3000 , TS3000-SE , TS3500 and TS3500-SE
Dedicated for silicon photonics on-wafer test
System compatibility
Silicon Photonics Fiber Alignment Systems
A Variety of fiber positioning stages and the related software can be easily used with the MPI SiPH probe system. The shortest platen to chuck distance allowing shorter fiber arms with higher stability and less measurement noise. Solutions for just single fiber or multi-fiber-arrays are available, all integrated with automated Z-sensing unit for constant distance of few micrometer to the optical I/O.
Necessary optical alignment stages, such as the hexapod, are fully integrated into the SENTIO® probe station control software. Those are operated just like any other automated positioner including its additional alignment features. And not only integrated in the multi touch software, even the hardware control panel supports the SiPH positioner type.