The Hioki FT4310 Bypass Diode Tester enables solar power system maintenance by detecting open and short-circuit faults in bypass diodes during daylight without needing to cover panels. Designed for PV module efficiency, it allows simultaneous measurement of electrical parameters and wireless data transfer via Bluetooth, ideal for engineers optimizing solar installations.
Key benefits
Detect open and short faults in bypass diodes even in daylight without panel coverage
Measure open-circuit voltage, short-circuit current, and bypass route resistance simultaneously
Enhance field efficiency by testing using junction box strings
Automatically transfer measurement data through Bluetooth® to Android and iOS devices
Download data directly to mobile devices using Hioki’s GENNECT Cross app